Quartz Crystal Microbalance with Dissipation monitoring (QCM-D) is a powerful technique for analyzing thin films and surface interactions. The fundamental frequency of the QCM-D sensor is determined by its thickness, and any external coating applied to the sensor will alter this frequency. Accurate measurement of the coating thickness, especially in the nanometer range, requires careful attention to both instrument precision and experimental protocol.
This standard operating procedure outlines the best practices for ex situ measurement of external coating thickness, ensuring reproducibility and high-quality data.
