Wettability measurements are gaining interest in semiconductor applications due to their ability to provide valuable information on surface properties in a fast and non-invasive fashion. Instruments dedicated to wettability measurements on wafers are thus sought after with an emphasis on the software tailored to serve the needs of this high-tech industrial sector.
In this webinar, you will learn more about:
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How contact angle measurements are utilized in semiconductor research.
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The key capabilities provided by tensiometers to support your work.
Presenter
