Recorded webinar

Optimizing semiconductor processing through wettability measurements on wafers

Wettability measurements are gaining interest in semiconductor applications due to their ability to provide valuable information on surface properties in a fast and non-invasive fashion. Instruments dedicated to wettability measurements on wafers are thus sought after with an emphasis on the software tailored to serve the needs of this high-tech industrial sector.

Webinar details

  • Originally aired
    April 10, 2025
  • Length
    43 min
  • Presentation by
    Susanna Laurén
  • Technologies
    Optical tensiometer
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Wafer Semiconductor

In this webinar:

  • How contact angle measurements are utilized in semiconductor research.

  • The key capabilities provided by tensiometers to support your work. 

susanna

Presentation by Susanna Laurén

Susanna Laurén, PhD, is Marketing Director at Biolin Scientific. With a strong background in and extensive experience in surface tension and contact angle measurements, Susanna specializes in applying these techniques to optimize industrial processes. Her expertise in wettability and adhesion makes her a leading authority on quality control and process improvement in semiconductor manufacturing. 

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