Information obtained with QSense QCM-D

- Analysis of surface interactions, reactions and layer properties

QSense QCM-D is a surface sensitive, real-time technology used to explore, characterize and optimize surface interactions, reactions as well as thin film properties. In this overview we summarize the information that can be extracted from the QCM-D analysis.

In this overview you will find: Overview information obtained with QSense QCM-D
  • A list of parameters and processes that can be monitored with QCM-D
  • A description of each parameter, what it is and what it means.
  • Examples of when the respective type information is useful.

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